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This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design.","brand":"WoB","offers":[{"title":"- \/ - \/ INTERNAL","offer_id":52664826724625,"sku":null,"price":0.0,"currency_code":"GBP","in_stock":true},{"title":"GB \/ NEW \/ INGRAM","offer_id":52664827478289,"sku":"NLS9780128007471","price":0.0,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0784\/4072\/6801\/files\/9780128007471.jpg?v=1762275661"}],"url":"https:\/\/www.worldofbooks.com\/de-de\/collections\/autor-buecher-von-joseph-bernstein.oembed","provider":"World of Books ","version":"1.0","type":"link"}