High Resolution X-Ray Diffractometry And Topography
Zusammenfassung
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High Resolution X-Ray Diffractometry And Topography by Dk Bowen
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
Bowen, D.K.; Tanner, Brian K.
| SKU | Nicht verfügbar |
| ISBN 13 | 9780850667585 |
| ISBN 10 | 0850667585 |
| Titel | High Resolution X-Ray Diffractometry And Topography |
| Autor | Dk Bowen |
| Buchzustand | Nicht verfügbar |
| Verlag | Taylor & Francis Ltd |
| Erscheinungsjahr | 1998-02-05 |
| Seitenanzahl | 264 |
| Hinweis auf dem Einband | Die Abbildung des Buches dient nur Illustrationszwecken, die tatsächliche Bindung, das Cover und die Auflage können sich davon unterscheiden. |
| Hinweis | Nicht verfügbar |