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Introduction to Scanning Tunneling Microscopy Third Edition By C. Julian Chen (Adjunct Senior Research Scientist and Adjunct Professor, Adjunct Senior Research Scientist and Adjunct Professor, Department of Applied Physics and Applied Mathematics, Columbia University)

Summary

This third edition is a thoroughly updated and improved version of the recognized "Bible" of the field.

Introduction to Scanning Tunneling Microscopy Third Edition Summary

Introduction to Scanning Tunneling Microscopy Third Edition by C. Julian Chen (Adjunct Senior Research Scientist and Adjunct Professor, Adjunct Senior Research Scientist and Adjunct Professor, Department of Applied Physics and Applied Mathematics, Columbia University)

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: "The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts". For the second edition, a 2017 book review published in the Journal of Applied Crystallography said "Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field". The third edition is a thoroughly updated and improved version of the recognized "Bible" of the field. Additions to the third edition include: theory, method, results, and interpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound.

Introduction to Scanning Tunneling Microscopy Third Edition Reviews

An excellent starting point to familiarize newcomers with the field, and an in-depth account of theoretical and practical aspects for the more experienced user. [...] Very useful as a textbook for teaching single-molecule studies, at both the beginners and the advanced level. * J. Elemans, Journal of Applied Crystallography, 2017 *
One of the most authoritative volumes in the field. * Martin Castell, University of Oxford *

About C. Julian Chen (Adjunct Senior Research Scientist and Adjunct Professor, Adjunct Senior Research Scientist and Adjunct Professor, Department of Applied Physics and Applied Mathematics, Columbia University)

C. Julian Chen received a PhD in Physics from Columbia University in 1985, and then joined the Department of Physical Sciences of IBM Watson Research Centre. In 1993, he published Introduction to Scanning Tunnelling Microscopy, and received a National Outstanding Book Award from China in 1997. From 1993 to 2003 he joined the Department of Human Language Technology of IBM Research. In 1998 he received an Outstanding Innovation Award from IBM for inventing practical recognition technology for Chinese speech. From 2004 to 2006 he was a Guest Scientist at Hamburg University. In 2007 he joined the Department of Applied Physics and Applied Mathematics at Columbia University.

Table of Contents

1: Overview Part 1: Principles 2: Tunneling Phenomenon 3: Tunneling Matrix Elements 4: Atomic Forces 5: Atomic Forces and Tunneling 6: Nanometer-Scale Imaging 7: Atomic-Scale Imaging 8: Imaging Wavefunctions 9: Nanomechanical Eects Part 2: Instrumentation 10: Piezoelectric Scanner 11: Vibration Isolation 12: Electronics and Control 13: Mechanical design 14: Tip Treatment Part 3: Related Methods 15: Scanning Tunneling Spectroscopy 16: Atomic Force Microscopy Appendix Appendix A: Green's Functions Appendix B: Real Spherical Harmonics Appendix C: Spherical Modied Bessel Functions Appendix D: Plane Groups and Invariant Functions Appendix E: Elementary Elasticity Theory

Additional information

NGR9780198856559
9780198856559
0198856555
Introduction to Scanning Tunneling Microscopy Third Edition by C. Julian Chen (Adjunct Senior Research Scientist and Adjunct Professor, Adjunct Senior Research Scientist and Adjunct Professor, Department of Applied Physics and Applied Mathematics, Columbia University)
New
Hardback
Oxford University Press
2021-02-28
496
N/A
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