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Design for Manufacturability and Yield for Nano-Scale CMOS Charles Chiang

Design for Manufacturability and Yield for Nano-Scale CMOS By Charles Chiang

Design for Manufacturability and Yield for Nano-Scale CMOS by Charles Chiang


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Summary

This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

Design for Manufacturability and Yield for Nano-Scale CMOS Summary

Design for Manufacturability and Yield for Nano-Scale CMOS by Charles Chiang

This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.

About Charles Chiang

Dr. Charles Chiang is R&D Director of the Advanced Technology Group at Synopsys Inc. in Mountain View, CA, USA

Table of Contents

1. Introduction of DFM/DFY. a. What is DFM/DFY ? historical perspective. b. Why is it becoming ever so critical? c. DFM categories & classifications. d. How do various DFM solutions tie up with specific design flows. e. DFM & DFY are intertwined. 2. Random Defects. a. CAA. b. Improving CAA. c. Cell library yield grading based on CAA. 3. Systematic yield. a. Lithography. 4. Systematic yield. b. CMP 5. Parametric yield. a. Intro. b. Timing aspects. c. Power considerations. 6. Design for yield. a. analysis. b. prediction. c. enhancement. 7. Summary and Conclusions

Additional information

NLS9789048173037
9789048173037
9048173035
Design for Manufacturability and Yield for Nano-Scale CMOS by Charles Chiang
New
Paperback
Springer
2010-11-22
255
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
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