{"title":"Parag K Lala","description":null,"products":[{"product_id":"self-checking-and-fault-tolerant-digital-design-book-parag-k-lala-9780124343702","title":"Self-Checking and Fault-Tolerant Digital Design","description":"With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems.","brand":"WoB","offers":[{"title":"- \/ - \/ -","offer_id":50483547799825,"sku":"","price":0.0,"currency_code":"GBP","in_stock":true},{"title":"GB \/ VERY_GOOD \/ INTERNAL","offer_id":50483548324113,"sku":"GOR009679917","price":0.0,"currency_code":"GBP","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0784\/4072\/6801\/files\/B00BG7IHYW.jpg?v=1750939975"},{"product_id":"introduction-to-logic-circuit-testing-book-parag-k-lala-9783031797842","title":"An Introduction to Logic Circuit Testing","description":"An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits\/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.\n\nTable of Contents: Introduction \/ Fault Detection in Logic Circuits \/ Design for Testability \/ Built-in Self-Test \/ References","brand":"WoB","offers":[{"title":"- \/ - \/ -","offer_id":51717884772625,"sku":"","price":0.0,"currency_code":"GBP","in_stock":true},{"title":"GB \/ NEW \/ GARDNERS","offer_id":51717885329681,"sku":"NGR9783031797842","price":0.0,"currency_code":"GBP","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0784\/4072\/6801\/files\/3031797841.png?v=1785886496"},{"product_id":"digital-systems-design-using-programmable-logic-devices-book-parag-k-lala-9780132150880","title":"Digital Systems Design Using Programmable Logic Devices","description":null,"brand":"WoB","offers":[{"title":"- \/ - \/ INTERNAL","offer_id":53742827569425,"sku":null,"price":0.0,"currency_code":"GBP","in_stock":true},{"title":"US \/ GOOD \/ SBYB","offer_id":53742827929873,"sku":"CIN0132150883G","price":0.0,"currency_code":"GBP","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0784\/4072\/6801\/files\/9780132150880.jpg?v=1783393213"}],"url":"https:\/\/www.worldofbooks.com\/en-au\/collections\/author-books-by-parag-k-lala.oembed","provider":"World of Books ","version":"1.0","type":"link"}