Design-For-Test For Digital IC's and Embedded Core Systems by Alfred Crouch

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Design-For-Test For Digital IC's and Embedded Core Systems by Alfred Crouch

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Summary

Provides testing strategies that address business needs for quality, reliability, and cost control. This book helps to optimize the engineering trade-offs between resources such as silicon area, operating frequency, and power consumption. Focusing on automatic test pattern generation (ATPG), it is for the engineers involved in design and testing.

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Design-For-Test For Digital IC's and Embedded Core Systems by Alfred Crouch

The purpose of this book is to introduce the basic concepts of test and design-for-test (DFT), and to then address the application of these concepts with an eye toward the trade-offs of the engineering budgets (area, frequency, power, etc.), the business drivers, and the cost drivers. This practical guide on the test and Design-for-test topics has been developed along the lines of a just what you need to know and how to do it guide that explains the topic, the trade-offs, and relates the topic to the design flow.

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AL CROUCH began his testing career repairing meteorological equipment for the U.S. Air Force. He later earned BSEE and MSEE degrees from the University of Kentucky. He has worked for Texas Instruments, Digital Equipment Corporation, and Motorola, focusing on design-for-test, test automation, and computer aided testing. He has been issued nine U.S. Patents and is an experienced trainer and conference presenter.

SKU Unavailable
ISBN 13 9780130848277
ISBN 10 0130848271
Title Design-For-Test For Digital IC's and Embedded Core Systems
Author Alfred Crouch
Condition Unavailable
Publisher Pearson Education (US)
Year published 1999-09-27
Number of pages 384
Cover note Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
Note Unavailable