Statistical Process Control by John Oakland

Statistical Process Control by John Oakland

Regular price
Checking stock...
Regular price
Checking stock...
Summary

This work presents the foundations of good quality management and process control, including an explanation of what quality is, and control of conformance and consistency during production. It covers the theory and techniques in a practical and non-mathematical manner.

The feel-good place to buy books
  • Free delivery in Australia
  • Supporting authors with AuthorSHARE
  • 100% recyclable packaging
  • Proud to be a B Corp – A Business for good
  • Buy-back with Ziffit

Statistical Process Control by John Oakland

This work presents the foundations of good quality management and process control, including an explanation of what quality is, and control of conformance and consistency during production. It covers the theory and techniques in a practical and non-mathematical manner.

John S. Oakland is both Chairman and Head of Research and Education at Oakland Consulting LLP. He is also Emeritus Professor of Business Excellence and Quality Management at Leeds University Business School, UK. He is the author of numerous texts on Quality Management.

Marton Marosszeky retired from a full-time professorship at UNSW, Australia, in 2006 and has been working as a lean consultant since then. Between 2007 and 2012 he was the leader of the lean consulting service line within Evans and Peck. He has worked with major project teams and company executives supporting them in developing and implementing lean/quality-based management strategies in the infrastructure (road and rail), building construction, and oil and gas industries across four continents.

SKU Unavailable
ISBN 13 9780750624640
ISBN 10 0750624647
Title Statistical Process Control
Author John Oakland
Condition Unavailable
Binding Type Hardback
Publisher Taylor & Francis Ltd
Year published 1996-09-19
Number of pages 352
Cover note Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
Note Unavailable