Introduction to Advanced System-on-Chip Test Design and Optimization by Erik Larsson

Introduction to Advanced System-on-Chip Test Design and Optimization by Erik Larsson

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Dr. Erik Larsson is an assistant professor at Linköpings University in Sweden, and he is an active member of the IEEE Testing and Circuits & Systems societies

SKU	Non disponible
ISBN 13	9781402032073
ISBN 10	1402032072
Titre	Introduction to Advanced System-on-Chip Test Design and Optimization
Auteur	Erik Larsson
Série	Frontiers In Electronic Testing
État	Non disponible
Type de reliure	Hardback
Éditeur	Springer-Verlag New York Inc.
Année de publication	2005-11-07
Nombre de pages	388
Note de couverture	La photo du livre est présentée à titre d'illustration uniquement. La reliure, la couverture ou l'édition réelle peuvent varier.
Note	Non disponible