GOR013381940

9780262513357

0262513358

Journey to Data Quality by Yang W. Lee

Used - Very Good

Paperback

MIT Press Ltd

20090901

240

N/A

Book picture is for illustrative purposes only, actual binding, cover or edition may vary.

This is a used book - there is no escaping the fact it has been read by someone else and it will show signs of wear and previous use. Overall we expect it to be in very good condition, but if you are not entirely satisfied please get in touch with us