Atomic Force Microscopy: A Concise Introduction
The feel-good place to buy books
Atomic Force Microscopy: A Concise Introduction by Burnham Nancy A
This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) — a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.| SKU | Unavailable |
| ISBN 13 | 9789819824304 |
| ISBN 10 | 9819824303 |
| Title | Atomic Force Microscopy: A Concise Introduction |
| Author | Burnham Nancy A |
| Condition | Unavailable |
| Binding Type | Paperback |
| Publisher | World Scientific Publishing Co Pte Ltd |
| Year published | 2026-03-13 |
| Number of pages | 250 |
| Cover note | Book picture is for illustrative purposes only, actual binding, cover or edition may vary. |
| Note | Unavailable |