Microstructural Characterization of Materials by David Brandon
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle.David Brandon, Israel Institute of Technology, Haifa, Israel, is the author of Microstructural Characterization of Materials, 2nd Edition, published by Wiley.
Wayne D. Kaplan, Israel Institute of Technology, Haifa, Israel, is the author of Microstructural Characterization of Materials, 2nd Edition, published by Wiley.
| SKU | Unavailable |
| ISBN 13 | 9780470027851 |
| ISBN 10 | 0470027851 |
| Title | Microstructural Characterization of Materials |
| Author | David Brandon |
| Condition | Unavailable |
| Binding Type | Paperback |
| Publisher | John Wiley & Sons Inc |
| Year published | 2008-03-14 |
| Number of pages | 560 |
| Cover note | Book picture is for illustrative purposes only, actual binding, cover or edition may vary. |
| Note | Unavailable |