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In-Situ Microscopy in Materials Research Pratibha L. Gai

In-Situ Microscopy in Materials Research By Pratibha L. Gai

In-Situ Microscopy in Materials Research by Pratibha L. Gai

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Summary

2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1 Profile Mode 288 3. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 1 Surface Steps 295 3.

In-Situ Microscopy in Materials Research Summary

In-Situ Microscopy in Materials Research: Leading International Research in Electron and Scanning Probe Microscopies by Pratibha L. Gai

2. High Temperature UHV-STM System 264 3. Hydrogen Desorption Process on Si (111) Surface 264 4. (7x7) - (1 xl) Phase Transition on Si (111) Surface 271 Step Shifting under dc Electric Fields 275 5. 6. Conclusions 280 Acknowledgements and References 281 12. DYNAMIC OBSERVATION OF VORTICES IN SUPERCONDUCTORS USING ELECTRON WAVES 283 by Akira Tonomura 1. Introduction 283 2. Experimental Method 284 2. 1 Interference Microscopy 284 2. 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1. 1 Profile Mode 288 3. 1. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 3. 1 Surface Steps 295 3. 3. 2 Irradiated Point Defects 296 4. Conclusion 298 References 299 13. TEM STUDIES OF SOME STRUCTURALLY FLEXIBLE SOLIDS AND THEIR ASSOCIATED PHASE TRANSFORMATIONS 301 by Ray L. Withers and John G. Thompson 1. Introduction 301 2. Tetrahedrally Comer-Connected Framework Structures 302 3. Tetragonal a-PbO 311 4. Compositionally Flexible Anion-Deficient Fluorites and the "Defect Fluorite" to C-type Sesquioxide Transition 320 5. Summary and Conclusions 327 Acknowledgements and References 327 Author Index 331 Subject Index 333 List of Contributors A. ASEEV Institute of Semiconductor Physics, Russian Academy of Sciences Novosibirsk, 630090, pr. ac. , Lavrentjeva 13, RUSSIA E. BAUER Department of Physics and Astronomy, Arizona State University Tempe, AZ 85287-1504, U. S. A. G. H.

About Pratibha L. Gai

Pratibha L. Gai is a senior research associate at the Central Research and Development, Science and Engineering Laboratories, DuPont and an adj. professor at the University of Delaware, USA. After graduating with a PhD in physics from the University of Cambridge, England, she taught and conducted research, leading the surface reactions group at the University of Oxford, England. She was elected a fellow of Wolfson College, Oxford. Her research interests are theories and experimental aspects of electron diffraction, defects in solids, ceramics, superconductors, semiconductors, heterogeneous catalysis and chemical synthesis. She has published about 22 research papers and reviews and has given numerous invited lectures internationally. She has received several educational awards and joint grants for her key fundamental work on in-situ electron microscopy of heterogeneous catalysts, including by the Royal Society, UK and the American Chemical Society. She is a member and fellow of several professional scientific societies, Chartered Engineer of the Institute of Materials, UK and is on the editorial board of international scientific journals.

Table of Contents

1. In-Situ Applications of Low Energy Electron Microscopy (Leem).- 1. Introduction.- 2. Phase Transitions on Clean Surfaces.- 3. Segregation.- 4. Gas-Surface Interactions.- 5. Epitaxy.- 6. Summary.- Acknowledgements and References.- 2. Environmental Scanning Electron Microscopy.- 1. Introduction.- 2. Gas Dynamics.- 3. Electron Beam Transfer.- 4. Contrast and Resolution.- 5. Detection.- 6. Cathodoluminescence.- 7. X-rays.- 8. Beam Irradiation Effects.- 9. Operation and Applications.- 10. Conclusions.- Acknowledgements and References.- 3. ESEM Development and Application In Cultural Heritage Conservation.- 1. Introduction.- 2. Applications.- 3. ESEM and SEM: Operational Differences.- 4. ESEM/EDS Development (19901997).- 5. Future Work.- Acknowledgements and References.- 4. Intrinsic Point Defect Clustering In Si: A Study by HVEM and HREM In-Situ Electron Irradiation.- 1. Introduction.- 2. Experimental Details.- 3. Results and Discussion.- 4. Conclusion.- Acknowledgements and References.- 5. In-Situ Observation and Quantitative Analysis of Electromigration Void Dynamics.- 1. Introduction.- 2. Sample Fabrication and In-Situ Test Technique.- 3. Single Void Behavior.- 4. Void-Void Interactions.- 5. Void-Hillock Interactions.- 6. Summary and Conclusions.- Acknowledgements and References.- 6. Environmental High Resolution Electron Microscopy (EHREM) In Materials Science.- 1. Introduction.- 2. Experimental: In-Situ Controlled Environmental High Resolution Transmission EM (EHREM) Development for Gas-Solid Reactions on the Atomic Scale.- 3. Applications.- 4. Conclusions.- Acknowledgements and References.- 7. In-Situ Transmission Electron Microscopy of Thin Film Growth.- 1. Introduction.- 2. Role of TEM in Studies of Thin Film Growth.- 3. Instrumental Approaches.- 4. SomeResults.- 5. Conclusions.- Acknowledgements and References.- 8. HREM In-Situ Experiment at Very High Temperatures.- 1. Introduction.- 2. Specimen-Heating Holders.- 3. Electron Microscope.- 4. HREM Observation of Si Particle just below the Melting Point.- 5. Formation of SiC through Solid State Chemical Reactions.- between Si and Graphite.- 6. Sintering of SiC Crystals.- 7. Surface Reconstruction of Au-deposited Si.- 9. In-Situ REM and TEM Studies of Homo and Hetero-Epitaxy on Si Surfaces.- 1. Introduction.- 2. Experimental.- 3. Results and Discussion.- 4. Conclusions.- References.- 10. Atomic-Scale Fabrication of Metal Surfaces by Adsorption and Chemical Reaction.- 1. Introduction.- 2. Fabrication of Metal Surfaces by Physical Processes.- 3. Fabrication of Metal Surfaces by Chemical Reaction.- 4. Nano-meter Scale Patterning by Chemical Reactions.- References.- 11. High Temperature Dynamic Behavior of Silicon Surfaces Studied by Scanning Tunneling Microscopy (STM).- 1. Introduction.- 2. High Temperature UHV-STM System.- 3. Hydrogen Desorption Process on Si (111) Surface.- 4. (77) - (11) Phase Transition on Si (111) Surface.- 5. Step Shifting under dc Electric Fields.- 6. Conclusions.- Acknowledgements and References.- 12. Dynamic Observation of Vortices in Superconductors Using Electron Waves.- 1. Introduction.- 2. Experimental Method.- 3. Observation of Superconducting Vortices.- 4. Conclusion.- References.- 13. TEM Studies of Some Structurally Flexible Solids and Their Associated Phase Transformations.- 1. Introduction.- 2. Tetrahedrally Corner-Connected Framework Structures.- 3. Tetragonal ?-PbO.- 4. Compositionally Flexible Anion-Deficient Fluorites.- and the Defect Fluorite to C-type Sesquioxide Transition.- 5. Summary and Conclusions.- Acknowledgementsand References.- Author Index.

Additional information

NPB9780792399896
9780792399896
0792399897
In-Situ Microscopy in Materials Research: Leading International Research in Electron and Scanning Probe Microscopies by Pratibha L. Gai
Pratibha L. Gai
New
Hardback
Springer
1997-09-30
336
N/A
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