Cart
Free US shipping over $10
Proud to be B-Corp

Digital Noise Monitoring of Defect Origin Telman Aliev

Digital Noise Monitoring of Defect Origin By Telman Aliev

Digital Noise Monitoring of Defect Origin by Telman Aliev


$139.49
Condition - New
Only 2 left

Summary

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others.

Digital Noise Monitoring of Defect Origin Summary

Digital Noise Monitoring of Defect Origin by Telman Aliev

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Digital Noise Monitoring of Defect Origin Reviews

From the reviews:

The monograph builds on a long series of publications by the author over the last decade. monograph should benefit researchers and practicing engineers particularly those in search of new application tools in quality engineering applied in a broad setting. In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry. (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)

Table of Contents

Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.

Additional information

NPB9780387717531
9780387717531
0387717536
Digital Noise Monitoring of Defect Origin by Telman Aliev
New
Hardback
Springer-Verlag New York Inc.
2007-07-25
224
N/A
Book picture is for illustrative purposes only, actual binding, cover or edition may vary.
This is a new book - be the first to read this copy. With untouched pages and a perfect binding, your brand new copy is ready to be opened for the first time

Customer Reviews - Digital Noise Monitoring of Defect Origin