Applied Measurement with jMetrik by J Patrick Meyer

Applied Measurement with jMetrik by J Patrick Meyer

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. Applied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis. Each chapter focuses on a topic in measurement, describes the steps for using jMetrik, and provides one or more examples of conducting an analysis on the topic. Recommendations and guidance for practice is provided throughout the book.

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

SKU	Unavailable
ISBN 13	9780415531979
ISBN 10	0415531977
Title	Applied Measurement with jMetrik
Author	J Patrick Meyer
Condition	Unavailable
Binding Type	Paperback
Publisher	Taylor & Francis Ltd
Year published	2014-06-25
Number of pages	170
Cover note	Book picture is for illustrative purposes only, actual binding, cover or edition may vary.