Applied Reliability, Third Edition by Paul A Tobias
This reference on applied reliability focuses on the problems that engineers deal with every day. The second edition adds over 170 pages of material to the contents of the first edition. It includes treatment of life distribution and accelerated testing models, data analysis, and more.Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society's Lifetime Achievement Award.
| SKU | Unavailable |
| ISBN 13 | 9780442004699 |
| ISBN 10 | 0442004699 |
| Title | Applied Reliability, Third Edition |
| Author | Paul A Tobias |
| Condition | Unavailable |
| Binding Type | Hardback |
| Publisher | Taylor & Francis Ltd |
| Year published | 1995-01-01 |
| Number of pages | 424 |
| Cover note | Book picture is for illustrative purposes only, actual binding, cover or edition may vary. |
| Note | Unavailable |