Atomic Force Microscopy: A Concise Introduction by Burnham Nancy A

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Atomic Force Microscopy: A Concise Introduction by Burnham Nancy A

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Atomic Force Microscopy: A Concise Introduction by Burnham Nancy A

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) — a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

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SKU Unavailable
ISBN 13 9789819824304
ISBN 10 9819824303
Title Atomic Force Microscopy: A Concise Introduction
Author Burnham Nancy A
Condition Unavailable
Binding Type Paperback
Publisher World Scientific Publishing Co Pte Ltd
Year published 2026-03-13
Number of pages 250
Cover note Book picture is for illustrative purposes only, actual binding, cover or edition may vary.

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