Beam Injection Assessment of Defects in Semiconductors
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Beam Injection Assessment of Defects in Semiconductors by Martin Kittler
The 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98) focussed on many theoretical and experimental aspects of this topic. The aim was to bring together specialists working in the fields of both fundamental research and applications. There were more than 80 participants from 15 countries all over the world.| SKU | Unavailable |
| ISBN 13 | 9783908450399 |
| ISBN 10 | 390845039X |
| Title | Beam Injection Assessment of Defects in Semiconductors |
| Author | Martin Kittler |
| Series | Solid State Phenomena |
| Condition | Unavailable |
| Binding Type | Paperback |
| Publisher | Trans Tech Publications Ltd |
| Year published | 1998-12-18 |
| Number of pages | 550 |
| Cover note | Book picture is for illustrative purposes only, actual binding, cover or edition may vary. |
| Note | Unavailable |