Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic by Tongtong Liu

Regular price
Checking stock...
Regular price
Checking stock...
Summary

This volume gathers the latest advances, innovations and applications in the field of efficiency and performance engineering, as presented by leading international researchers and engineers at the TEPEN International Workshop on Fault Diagnostics and Prognostics (TEPEN-IWFDP), held in Qingdao, China on May 8-11, 2024.

The feel-good place to buy books
  • Free US shipping over $15
  • Buying preloved emits 41% less CO2 than new
  • Millions of affordable books
  • Give your books a new home - sell them back to us!

Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic by Tongtong Liu

This volume gathers the latest advances, innovations and applications in the field of efficiency and performance engineering, as presented by leading international researchers and engineers at the TEPEN International Workshop on Fault Diagnostics and Prognostics (TEPEN-IWFDP), held in Qingdao, China on May 8-11, 2024. Topics include machine and structural health monitoring, non-destructive testing and fault detection, diagnostic and prognostic for both operational and manufacturing processes, maintenance optimization and asset management, smart metamaterials and metastructures, artificial intelligent and machine learning. The contributions, which were selected through a rigorous international peer-review process, share exciting ideas that will spur novel research directions and foster new multidisciplinary collaborations.

SKU Unavailable
ISBN 13 9783031694851
ISBN 10 3031694856
Title Proceedings of the TEPEN International Workshop on Fault Diagnostic and Prognostic
Author Tongtong Liu
Series Mechanisms And Machine Science
Condition Unavailable
Binding Type Paperback
Publisher Springer International Publishing AG
Year published 2025-09-05
Number of pages 597
Cover note Book picture is for illustrative purposes only, actual binding, cover or edition may vary.