Simple Tools and Techniques for Enterprise Risk Management by Robert Chapman

Simple Tools and Techniques for Enterprise Risk Management by Robert Chapman

Your business reputation can take years to build and mere minutes to destroy The range of business threats is evolving rapidly but your organization can thrive and gain a competitive advantage with your business vision for enterprise risk management.

About the author

ROBERT J. CHAPMAN is the Director of Risk Management in the Middle East for AECOM, a publicly traded company on the New York Stock Exchange, and listed on the Fortune 500 as one of America's largest companies. Prior to this he held the position of Director of Risk Management at a number of European companies and has provided risk management consultancy services in Holland, Ireland, South Africa, Qatar, England and the UAE to companies within the pharmaceutical, aviation, marine, rail, broadcast, heritage, health, education, manufacturing, water, sport, oil and gas, property development, construction and media sectors. He was made a Fellow of both the Institute of Risk Management (UK) and the Association for Project Management (UK) for his contribution to the development of the discipline of risk management. He has provided guidance to the Chartered Institute of Accountants in England and Wales in the form of a risk management handbook and was a co-author of Management of Risk: Guidance for Practitioners published by the Office of Government Commerce and Managing Business Risk published by Kogan Page. He has had articles on the subject of risk management published in three languages and has a PhD in risk management.

SKU	Unavailable
ISBN 13	9781119989974
ISBN 10	1119989973
Title	Simple Tools and Techniques for Enterprise Risk Management
Author	Robert Chapman
Series	The Wiley Finance Series
Condition	Unavailable
Binding Type	Hardback
Publisher	John Wiley & Sons Inc
Year published	2011-12-16
Number of pages	688
Cover note	Book picture is for illustrative purposes only, actual binding, cover or edition may vary.