Trusting Yourself by Mary Jane Ryan
Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.| SKU | Unavailable |
| ISBN 13 | 9780767914901 |
| ISBN 10 | 0767914902 |
| Title | Trusting Yourself |
| Author | Mary Jane Ryan |
| Condition | Unavailable |
| Binding Type | Hardback |
| Publisher | Broadway Books (A Division of Bantam Doubleday Dell Publishing Group Inc) |
| Year published | 2004-05-11 |
| Number of pages | 204 |
| Prizes | Nautilus Award |
| Cover note | Book picture is for illustrative purposes only, actual binding, cover or edition may vary. |
| Note | Unavailable |