VLSI Design and Test by Brajesh Rawat
This two-volume set CCIS 2983-2984 constitutes the referred proceedings of the 29th International Symposium on VLSI Design and Test, VDAT 2025, held in Chandigarh, India, during August 7–9, 2025.
The 105 full papers included in these volumes were carefully reviewed and selected from 415 submissions. They are organized into thematic sections as follows: Emerging Devices and Technology; Analog and Mixed Signal Design; Digital Design and Systems; Memory and Computing Architectures; RF and Embedded Systems; AI Accelerators and Advanced Architectures.
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Machine Learning and Data Mining for Sports Analytics
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Modeling and Simulation of Social-Behavioral Phenomena in Creative Societies
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Higher Education Learning Methodologies and Technologies Online
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Distributed Computer and Communication Networks
- Recent Trends in Image Processing and Pattern Recognition
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New Trends in Database and Information Systems
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Science, Engineering Management and Information Technology
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Metadata and Semantic Research
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Information Management
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Discrete and Computational Geometry, Graphs and Games
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Software Technologies
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Computer Networks
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Explainable AI in Space
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Systems, Software and Services Process Improvement and Innovation
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Management of Digital EcoSystems
| SKU | Unavailable |
| ISBN 13 | 9783032263049 |
| ISBN 10 | 3032263042 |
| Title | VLSI Design and Test |
| Author | Brajesh Rawat |
| Series | Communications In Computer And Information Science |
| Condition | Unavailable |
| Binding Type | Paperback |
| Publisher | Springer Nature Switzerland AG |
| Year published | 2026-10-28 |
| Number of pages | 574 |
| Cover note | Book picture is for illustrative purposes only, actual binding, cover or edition may vary. |
| Note | Unavailable |