When Your Grandparent Dies
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When Your Grandparent Dies by R W Alley
Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an International Workshop on Designing for Yield at Oxford University. Edited papers of that workshop were published in reference I. The participants in that workshop agreed that meetings of this type should he con- tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the IE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series 21.| SKU | Unavailable |
| ISBN 13 | 9780870293641 |
| ISBN 10 | 0870293648 |
| Title | When Your Grandparent Dies |
| Author | R W Alley |
| Series | Elf-Help Books For Kids |
| Condition | Unavailable |
| Binding Type | Paperback |
| Publisher | Abbey Press |
| Year published | 2002-06-01 |
| Number of pages | 1 |
| Cover note | Book picture is for illustrative purposes only, actual binding, cover or edition may vary. |
| Note | Unavailable |