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Advances in Imaging and Electron Physics Editor-in-chief Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Advances in Imaging and Electron Physics By Editor-in-chief Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Summary

This volume merges Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. It is part of a series which features articles on the physics of electron devices, particle optics at high and low energies, microlithography and image science.

Advances in Imaging and Electron Physics Summary

Advances in Imaging and Electron Physics: Volume 109 by Editor-in-chief Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging and Electron Physics Reviews

Praise for the Series Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf. --MRS BULLETIN With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest. --J.A. Chapman in LABORATORY PRACTICE

About Editor-in-chief Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

Forthcoming Contributions Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques Complex Dyadic Multiresolution Analyses Lattice Vector Quantization for Wavelet-Based Image Coding Fuzzy Cellular Neural Networks and Their Applications to Image Processing Index

Additional information

NPB9780120147519
9780120147519
0120147513
Advances in Imaging and Electron Physics: Volume 109 by Editor-in-chief Peter W. Hawkes (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France)
New
Hardback
Elsevier Science Publishing Co Inc
1999-09-28
453
N/A
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