
Data Quality by Jack E Olson
Data Quality: The Accuracy Dimension is about assessing the quality of corporate data and improving its accuracy using the data profiling method. Corporate data is increasingly important as companies continue to find new ways to use it. Likewise, improving the accuracy of data in information systems is fast becoming a major goal as companies realize how much it affects their bottom line. Data profiling is a new technology that supports and enhances the accuracy of databases throughout major IT shops. Jack Olson explains data profiling and shows how it fits into the larger picture of data quality.
"Jack Olson's contribution represents the superb blend of theory and guidance from a master practitioner" --Peter Aiken
Jack E. Olson is a widely recognized database technology expert. His career includes significant contributions at IBM, BMC, Evoke, and now NEON Enterprise Software, where he serves as Chief Technology Office. Olson is author of Data Quality: The Accuracy Dimension, also published by Morgan Kaufmann. The inventor of record on several patents, he holds a BS from the Illinois Institute of Technology and an MBA from Northwestern University.
| SKU | Unavailable |
| ISBN 13 | 9781558608917 |
| ISBN 10 | 1558608915 |
| Title | Data Quality |
| Author | Jack E Olson |
| Series | The Morgan Kaufmann Series In Data Management Systems |
| Condition | Unavailable |
| Binding Type | Paperback |
| Publisher | Elsevier Science & Technology |
| Year published | 2003-01-09 |
| Number of pages | 312 |
| Cover note | Book picture is for illustrative purposes only, actual binding, cover or edition may vary. |
| Note | Unavailable |


































































